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1. US20210172798 - SYSTEMS AND METHODS FOR IN SITU OPTIMIZATION OF TUNABLE LIGHT EMITTING DIODE SOURCES

Office
United States of America
Application Number 17112393
Application Date 04.12.2020
Publication Number 20210172798
Publication Date 10.06.2021
Publication Kind A1
IPC
G01J 3/28
GPHYSICS
01MEASURING; TESTING
JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
3Spectrometry; Spectrophotometry; Monochromators; Measuring colours
28Investigating the spectrum
G01J 3/10
GPHYSICS
01MEASURING; TESTING
JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
3Spectrometry; Spectrophotometry; Monochromators; Measuring colours
02Details
10Arrangements of light sources specially adapted for spectrometry or colorimetry
CPC
G01J 2003/283
GPHYSICS
01MEASURING; TESTING
JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
3Spectrometry; Spectrophotometry; Monochromators; Measuring colours
28Investigating the spectrum
283computer-interfaced
G01J 3/2823
GPHYSICS
01MEASURING; TESTING
JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
3Spectrometry; Spectrophotometry; Monochromators; Measuring colours
28Investigating the spectrum
2823Imaging spectrometer
G01J 3/10
GPHYSICS
01MEASURING; TESTING
JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
3Spectrometry; Spectrophotometry; Monochromators; Measuring colours
02Details
10Arrangements of light sources specially adapted for spectrometry or colorimetry
Applicants CHEMIMAGE CORPORATION
Inventors Shawna TAZIK
Alyssa ZRIMSEK
Heather GOMER
Jihang WANG
Patrick J. TREADO
Title
(EN) SYSTEMS AND METHODS FOR IN SITU OPTIMIZATION OF TUNABLE LIGHT EMITTING DIODE SOURCES
Abstract
(EN)

Systems for and methods for in situ optimization of tunable light emitting diode sources are disclosed herein. During operation, the systems and methods obtain real-time feedback from an image sensor, and that feedback is used to tune the tunable LEDs. By tuning the tunable LEDs, the best values for the LED spectral output can be selected based on the feedback from the image sensor, and an image with improved contrast is obtained. Alternatively, the amount of time to obtain an image with acceptable contrast is reduced.

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