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1. WO2021081333 - MEASURING AND EVALUATING A TEST SIGNAL GENERATED BY A DEVICE UNDER TEST (DUT)

Publication Number WO/2021/081333
Publication Date 29.04.2021
International Application No. PCT/US2020/057076
International Filing Date 23.10.2020
IPC
G01R 23/16 2006.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
23Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
16Spectrum analysis; Fourier analysis
G01R 23/02 2006.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
23Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
02Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage
G01R 13/02 2006.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
13Arrangements for displaying electric variables or waveforms
02for displaying measured electric variables in digital form
G01R 31/01 2006.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
01Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
CPC
G01R 31/2879
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
2851Testing of integrated circuits [IC]
2855Environmental, reliability or burn-in testing
2872related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
2879related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads
G01R 31/31937
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
317Testing of digital circuits
3181Functional testing
319Tester hardware, i.e. output processing circuit
3193with comparison between actual response and known fault free response
31937Timing aspects, e.g. measuring propagation delay
H04L 1/06
HELECTRICITY
04ELECTRIC COMMUNICATION TECHNIQUE
LTRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
1Arrangements for detecting or preventing errors in the information received
02by diversity reception
06using space diversity
H04L 1/242
HELECTRICITY
04ELECTRIC COMMUNICATION TECHNIQUE
LTRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
1Arrangements for detecting or preventing errors in the information received
24Testing correct operation
242by comparing a transmitted test signal with a locally generated replica
H04R 29/001
HELECTRICITY
04ELECTRIC COMMUNICATION TECHNIQUE
RLOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKE ACOUSTIC ELECTROMECHANICAL TRANSDUCERS; DEAF-AID SETS; PUBLIC ADDRESS SYSTEMS
29Monitoring arrangements; Testing arrangements
001for loudspeakers
H04R 29/008
HELECTRICITY
04ELECTRIC COMMUNICATION TECHNIQUE
RLOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKE ACOUSTIC ELECTROMECHANICAL TRANSDUCERS; DEAF-AID SETS; PUBLIC ADDRESS SYSTEMS
29Monitoring arrangements; Testing arrangements
008Visual indication of individual signal levels
Applicants
  • ROKU, INC. [US]/[US]
Inventors
  • OSMANOVIC, Nermin
Agents
  • LEE, Michael Q.
  • BANOWIT, Donald R.
  • BEMBEN, Richard M.
  • BEZOS, Salvador M.
  • BLOCK, Daniel S.
  • BODENSTEIN, Matthew
  • CALVO, Paul A.
  • CAMARCE, Christian A.
  • CIMBALA, Michele A.
  • COLLER III, Richard D.
  • CONKLIN, Kyle
  • COVERT, John M.
  • DESAI, Nirav N.
  • DURKIN, Tracy-Gene G.
  • EISENBERG, Jason D.
  • ELLISON, Eldora L.
  • ESMOND, Robert W.
  • FEATHERSTONE, Donald J.
  • FITZSIMMONS, Jason A.
  • FRUEAUF, Jeremiah B.
  • GAJEWSKI, Daniel
  • GLENN, Dallin G.
  • GOLDSTEIN, Jorge A.
  • HELVEY, Jeffrey T.
  • HICKS, Ross
  • HOLMAN, David H.
  • HOLOUBEK, Michelle K.
  • JACKMAN, Peter A.
  • KENTON, JR., Lestin L.
  • KIM, Ji-Eun
  • LAROCK, Adam C.
  • LONGSWORTH, Gaby L.
  • MILLONIG, Robert C.
  • MUTSCHELKNAUS, Joseph
  • NANNENGA-COMBS, Bonnie
  • PHERO, Graham C.
  • PICKARD, Byron L.
  • RAY, Michael B.
  • RICHARDSON, Ryan C.
  • ROSE GILLENTINE, Marsha
  • RYGIEL, Mark W.
  • SHEA, JR., Timothy J.
  • SOKOHL, Robert E.
  • STEFFE, Eric K.
  • STERLING, Deborah A.
  • STERNE, Robert Greene
  • TUMINARO, Jonathan
  • SPECHT, Michael D.
  • VIRA, Chandrika
  • VARUGHESE, Dennies
  • POWERS III, R. Wilson
  • WRIGHT, Jon E.
  • YONAN, Daniel E.
Priority Data
16/662,78524.10.2019US
Publication Language English (EN)
Filing Language English (EN)
Designated States
Title
(EN) MEASURING AND EVALUATING A TEST SIGNAL GENERATED BY A DEVICE UNDER TEST (DUT)
(FR) MESURE ET ÉVALUATION D'UN SIGNAL DE TEST GÉNÉRÉ PAR UN DISPOSITIF TESTÉ (DUT)
Abstract
(EN)
Embodiments described herein generally relate to measuring and evaluating a test signal generated by a device under test (DUT). In particular, the test signal generated by the DUT may be compared to a reference signal and scored based on the comparison. For example, a method may include: capturing a test signal from a device under test; splicing the test signal into a plurality of test audio files based on a plurality of frequency bins; at each frequency bin, comparing each of the plurality of test audio files to a corresponding reference audio file from among a plurality of reference audio files, the plurality of reference audio files being associated with a reference signal; and calculating a performance score of the device under test based on the comparisons.
(FR)
Des modes de réalisation de la présente invention concernent généralement la mesure et l'évaluation d'un signal de test généré par un dispositif testé (DUT). En particulier, le signal de test généré par le DUT peut être comparé à un signal de référence et noté sur la base de la comparaison. Par exemple, un procédé peut consister à : capturer un signal de test à partir d'un dispositif testé ; épisser le signal de test en une pluralité de fichiers audio de test sur la base d'une pluralité de compartiments de fréquence ; au niveau de chaque compartiment de fréquence, comparer chaque fichier de la pluralité de fichiers audio de test à un fichier audio de référence correspondant parmi une pluralité de fichiers audio de référence, la pluralité de fichiers audio de référence étant associés à un signal de référence ; et calculer un score de performances du dispositif testé sur la base des comparaisons.
Also published as
Latest bibliographic data on file with the International Bureau